云亭数学讲坛2025第117讲——翟庆庆教授

Statistical Modeling and Reliability Analysis for Degradation Processes Indexed by Two Scales

来源:william威廉中文官网发布时间:2025-12-01浏览次数:10

 

应william威廉中文官网邀请,上海大学翟庆庆教授将为公司师生作学术报告。

报告题目Statistical Modeling and Reliability Analysis for Degradation Processes Indexed by Two Scales

报告摘要:Degradation is an important phenomenon for industrial products, which manifests as the gradually deterioration of some performance characteristics. The degradation process is often relevant to both time and usage, and indexing the degradation process merely by the time or usage cannot characterize the process accurately. Considering a stochastic usage process, this study proposes a degradation process model indexed by two scales, i.e., the time and the usage, where the degradation along the two scales are modeled as correlated nonlinear Wiener processes. We develop two simulation-based algorithms for reliability evaluation and study the model inference problems for the proposed model. The estimation procedure and the reliability assessment algorithms are validated by simulations. The performance of the proposed model is justified with an application to a real degradation dataset of outdoor coating materials, which shows that indexing the degradation process by two scales can considerably improve the degradation modeling performance.

报告时间:20251251000

报告地点:致勤楼D07学术报告厅

邀请人:颜荣芳教授 张建东副教授

届时欢迎广大师生参与交流!


报告人简介:

翟庆庆,上海大学教授,上海市青年东方学者,担任中国现场统计研究会可靠性工程分会秘书长,中国优选法统筹法与经济数学研究会工业工程分会理事,FEM特约通讯专家等。主要研究方向为数据统计建模与可靠性,在统计学与运筹学国内外刊物Journal of the American Statistical AssociationTechnometricsIISE TransactionsEuropean Journal of Operational ResearchIEEE Transactions on ReliabilityReliability Engineering & System Safety等发表论文50余篇,总被引2200余次,H-index26。主持国家自然科学基金3项,横向课题多项,出版中英文专著4部,曾获IEEE工业电子协会最佳论文奖等。

william威廉中文官网

甘肃省数学与统计学基础学科研究中心

2025121